Abstract
‘USG 3209’/‘Jaypee’ (Reg. No. MP‐3, NSL 465777 MAP), is a soft red winter wheat (Triticum aestivum L.) recombinant inbred line (RIL) population developed by Virginia Polytechnic Institute and State University and submitted to the USDA–ARS National Small Grains Germplasm Research Facility in Aberdeen, ID, in 2008. This mapping population is composed of 130 F11:12 RILs and has been used to study the genetics of adult plant resistance to powdery mildew [Blumeria graminis (DC) E.O. Speer] and leaf rust (Puccinia triticina Eriks.), and soft winter wheat milling and baking quality. Genetic linkage maps of this population were created to identify quantitative trait loci governing these traits. The genetic marker data collected on this population has been submitted to the GrainGenes database (http://wheat.pw.usda.gov) and includes data from both microsatellite and Diversity Array Technology markers.
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