Registration of TARS‐MST1 and SB‐DT1 Multiple‐Stress‐Tolerant Black Bean Germplasm

Abstract

High‐ambient‐temperature stress, drought stress, root rot disease, and common bacterial blight [CBB; caused by Xanthomonas axonopodis pv. phaseoli (Smith) Dye] cause widespread yield reductions in common bean (Phaseolus vulgaris L.) worldwide. TARS‐MST1 (Reg. No. GP‐284, PI 661512) and SB‐DT1 (Reg. No. GP‐283, PI 661970) were developed by the USDA‐ARS, the University of Nebraska Agricultural Research Division, and the University of Puerto Rico Agricultural Experiment Station. These black bean lines were selected for tolerance to multiple stresses, including tolerance to high ambient temperature and drought. Specifically, both lines showed significantly higher yields under heat stress compared with the local check and had comparable yields to both heat‐ and drought‐tolerant controls under those stress conditions. TARS‐MST1 possesses resistance to CBB, and both lines are tolerant to root rot diseases. They incorporate exotic sources of stress tolerance, thus serving to diversify U.S. common bean germplasm. The lines were characterized for markers related to Bean common mosaic virus and CBB, and both lines carry the I gene, while TARS‐MST1 was positive for the presence of two CBB SCAR markers, SU91 and SAP6. The use of this germplasm in breeding programs can serve to improve the yield and stress tolerance of common bean.