Abstract
Soybean rust (SBR), caused by an obligate biotrophic basidiomycete fungus, Phakopsora pachyrhizi, arrived in the continental United States in 2004, where it has since proven to be detrimental to southern soybean [Glycine max (L.) Merr.] production due to yield losses, environmental concerns, and expenses caused by reliance on fungicides for control. Resistance to SBR has been developed primarily by introgressing single, dominant resistance gene(s) into an elite soybean cultivar. Here we describe four near‐isogenic lines (NILs) of G00‐3213: G00‐3213Rpp1 (Reg. No. GP‐400, PI 676017), G00‐3213Rpp2 (Reg. No. GP‐401, PI 676018), G00‐3213Rpp3 (Reg. No. GP‐402, PI 676019), and G00‐3213Rpp4 (Reg. No. GP‐403, PI 676020). These NILs were developed by backcrossing rust resistance genes Rpp1, Rpp2, Rpp3, or Rpp4 into G00‐3213, an elite, maturity group VII soybean line. The NILs have tawny pubescence, tan pod walls, and white flowers and had the same general appearance to the recurrent parent G00‐3213 in the field in 2014. Additionally, each NIL exhibits a similar level of resistance to the GA12 P. pachyrhizi bulk isolate as the original resistant sources of the Rpp genes. These NILs will be useful as parents for public and private plant breeders, as well as for extension agents, crop consultants, and plant pathologists in conducting in‐field determinations for Rpp gene effectiveness in the southern United States.
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