Registration of Five Spring Wheat Lines Resistant to Russian Wheat Aphid, Stem Rust (Ug99), Leaf Rust, and Stripe Rust

Abstract

Russian wheat aphid (RWA; Diuraphis noxia Kurdjumov) and wheat rusts (stem rust [caused by Puccinia graminis Pers.:Pers. f. sp. tritici Eriks. & E. Henn.], leaf rust [caused by Puccinia triticina Eriks.], and stripe rust [caused by Puccinia striiformis Westend. f. sp. tritici Eriks.]) are major constraints to wheat (Triticum aestivum L.) production. We aimed to combine resistance to these four biotic constraints in ‘Kariega’, a South African spring wheat cultivar. Five spring wheat lines, SA16486 (Reg. No. GP‐990, PI 674173), SA16487 (Reg. No. GP‐991, PI 674174), SA16488 (Reg. No. GP‐992, PI 674175), SA16490 (Reg. No. GP‐993, PI 674176), and SA16491 (Reg. No. GP‐994, PI 674177) were developed by the Agricultural Research Council‐Small Grain Institute, South Africa, and released in 2015. These F3:6 lines are descended from a top‐cross made in 2001 between two backcrossed lines, one with RWA resistance from PI 225227 (resistant to biotypes RWASA1, RWASA2, and RWASA3) and another with Sr35 (resistant to the Ug99 race group). Phenotypic screening for RWA resistance (using biotype RWASA1) and marker assisted selection for rust resistance genes including Sr35, Lr34/Yr18/Sr57/Pm38/Sb1/Ltn1, and QYr.sgi‐2B.1 were used to identify the targeted traits during selection. The unique combination of aphid and rust resistance, medium to high yield potential, and good end‐use quality makes these wheat lines useful for wheat breeders with an interest in these resistance traits.