Regions of validity of geometric optics and Kirchhoff approximations for reflection from Gaussian random rough dielectric surfaces

Abstract

In this paper, the effects of characteristics of incident light and the geometrical parameters to the reflectivity of dielectric Gaussian random rough surfaces are presented. The behaviors of the reflectivity vs. several parameters are quantified using approximate methods: the geometric optics approximation (GOA) and the Kirchhoff approximation (KA) and an exact method called integral method (IM). Finally, we determine the limits of validity of approximate methods by comparisons with IM results. The regions of validity of approximate methods depending of many geometrical and physical parameters: roughness, Brewster and shadowing effects, multiple reflections, surface materials, and nature of polarization. The broader domain of validity (DV) is for KA, at normal TE-polarized incident light, for the higher dielectric permittivity. However, the narrowed DV is for GOA, at normal TM-polarized incident light for lower dielectric permittivity.