Abstract

We report on combined dc and microwave electronic measurements of magnetic flux transport in micron and submicron-patterned high-${T}_{c}$ films. In a given temperature regime below the superconducting transition temperature ${T}_{c}$, the current-driven flux transport is restricted to flux motion guided by the submicron patterns. Via frequency-dependent measurements of the forward transmission coefficient ${S}_{21}$ it is demonstrated that the mechanism of the guided flux transport depends on the microwave frequency and the geometrical size of the superconducting structures. At low frequencies, flux is transported via Abrikosov vortices leading to additional microwave losses. Above a geometrically defined frequency, a different mechanism seems to be responsible for flux transport that does not contribute to the microwave losses and most likely represents a phase-slip type mechanism. The limiting vortex velocity obtained from the frequency dependence of the microwave properties agrees with the Larking-Ovchinnikov critical vortex velocity that is determined via dc pulse measurements. In spite of the change of mechanism, guidance of flux persists in these nanopatterns up to high frequencies of several GHz.

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