Abstract
In this study, we aimed to measure material dispersion in fused silica using a low coherence interferometric method. The measurement was carried out quickly and efficiently in a wide spectral range using this method. The refractive index and group index of fused silica were determined by capturing a few interferograms. The material dispersion was modeled using a Sellmeier equation with three resonances. Three different fits were investigated; the most appropriate fit was the one that used both the measured refractive and group indexes to model the dispersion. Second-order dispersion was also quantified, and zero-dispersion wavelength was determined.
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