Abstract
In this work the refractive index depth profile, its relaxation and the absorption were investigated in 2 MeV proton irradiated PDMS. The above parameters were determined by the spectroscopic ellipsometry technique. The refractive index depth profile follows roughly the shape of the Bragg curve for the penetrating protons. It is shown that the observed difference between the refractive index of the surface ( dn = 0.01) and deeper regions ( dn = 0.08) is high enough to accomplish waveguiding that is also demonstrated in this paper. This work serves as basis for the production of integrated optical components, e.g. waveguides, gratings or other optical devices, which are planned to be produced by ion irradiation in PDMS.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
