Abstract
The spatial resolution afforded by near-field scanning optical microscopy (NSOM) is primarily a function of tip size, tip morphology, and tip-sample separation. Combining scanning force microscopy with NSOM allows one to maintain a small tip-sample separation distance and, consequently, improve NSOM resolution. This provides, simultaneously, a topographic perspective of the sample as well as an NSOM image. We present in this paper an instrument that provides shear force and reflection NSOM images. In addition, with this microscope, we can also obtain Raman scattering information with comparable resolution. Data is provided on nonlinear optical crystals and gold-on-silicon samples.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
