Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

Abstract

The understanding of the correlation between the near-field images that are recorded by scanning near-field optical microscopy (SNOM) and the local optical properties of the sample surface (topography, index, etc.) is a condition for the development of such microscopes. The aim of this paper is to show that the “constant height imaging” (CHI) mode provides useful near-field characterizations, even in case of high-relief samples. Actually, the CHI near-field signal is free from perturbations brought by usual feedback regulation systems. Furthermore, we show a comparison between experimental and theoretical data to explain near-field image formation. Finally, we develop a specific method based on the Fourier spectral analysis to characterize the experimental SNOM setup working in CHI mode.