Reflection High-Energy Electron Diffraction Studies of Indium Phosphide Surface

Abstract

Reflection high-energy electron diffraction studies of single-crystal indium phosphide substrates have been performed. It is shown that the substrates do not undergo any deleterious changes during chemical etching or the back contact sintering process. The low-power plasma exposure of the substrates is, however, responsible for structural modifications at the front surface and the performance of indium tin oxide/indium phosphide solar cells.