Abstract
Ray tracing in uniaxial anisotropic materials is important because they are widely used for instrumentation, liquid-crystal displays, laser cavities, and quantum experiments. There are previous works regarding ray tracing refraction and reflection formulae using the common electromagnetic theory approach, but only the refraction formulae have been deduced using Huygens's principle. In this paper we obtain the reflection expressions using this unconventional approach with a specific coordinate system in which both refraction and reflection formulae are simplified as well as their deduction. We compute some numerical examples to compare them with the common expressions obtained using electromagnetic theory.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of the Optical Society of America. A, Optics, image science, and vision
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
