Reflection control by metal-dielectric-metal metasurfaces using offset micropatches at infrared wavelengths

Abstract

Metasurfaces offer a promising means for realizing compact high-performance optical devices. This study numerically and analytically investigated reflection control using a metal–dielectric–metal (MDM) metasurface. Its reflection wavelength and angle were determined using the thickness and refractive index of the dielectric layer owing to a phase change induced by the hybridized resonance mode formed therein. MDM metasurfaces with offset micropatches comprise a continuous metal layer with periodic dielectric and micropatch layers having different widths. These layers are offset to one side with respect to one another. These offset micropatches realized better control over the reflection direction and wavelength.