Abstract
The reflection of linearly polarized light from an ultrathin anisotropic dielectric film on isotropic absorbing substrate is investigated analytically in the long-wavelength limit. All analytical results are correlated with the numerical solution of the anisotropic reflection problem on the basis of rigorous electromagnetic theory. Simple analytical approach developed in this work not only gives a physical insight into the reflection problem but also provides a way of estimating the necessary experimental accuracy for optical diagnostics by reflection characteristics. It is shown that obtained expressions are of immediate interest for determining the parameters of anisotropic surface layers. Innovative possibilities for optical diagnostics of anisotropic properties of ultrathin dielectric layers upon absorbing materials are discussed.
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