Abstract
The accuracy of the unit-cell parameters refined by using the whole-powder-pattern decomposition method is discussed. Powders of W, ZnO, TiO2, BaTiO3 Mg2SiO4, Al2SiO5 (+α-SiO2), and monoclinic ZrO2 were used as test samples. Two internal standard reference materials of Si and CeO2 and two types of powder diffractometers were used for data collections. The systematic peak-shift was corrected by determining the unit-cell parameters and the error function simultaneously during the whole-pattern-fitting. The estimated standard deviations for sample means ranged from <10 ppm (10−6) in cubic symmetry to 20∼50 ppm in monoclinic symmetry. These analyses could be carried out almost automatically in a computation time of less than l min for each sample on a workstation. The use of symmetric experimental profiles, obtained by the suppression of axial divergence, is very effective and of essential importance for improving the accuracy of unit-cell parameters.
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