Abstract

The time-resolved x-ray measurement system using the TAC technique and the MCS technique has been improved after the previous SRI conference. The improved TAC technique enables us to measure a time-resolved x-ray diffraction intensity distribution across a laser spot at any time after laser flashing with a time resolution of 25 ns under the multibunch operation of synchrotron radiation sources. Optical fiber delay units are developed for the MCS technique instead of ECL delay units to obtain long delay time for detective signals.

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