Abstract

It has been previously established that calculations of intensity distributions in high-resolution electron-microscope images of crystal structures can reproduce the experimental observations. The use of comparisons Of observed and computed images for structure analysis has been extended for the first time to the refinement of a defect structure in the case of crystals of nominal composition 'GeNb9O25. The results show that previously proposed models for the disordered atom configurations around 'tetrahedral' sites are not completely correct. A new model is proposed which shows good agreement between computed and observed images. This model suggests an interpretation for observations on other related structures in terms of a new type of defect.

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