Abstract
Thin lysozyme films on single-crystal silicon wafers have been studied by X-ray reflectivity. The films have been formed using the modified Langmuir–Schaefer method with potassium chloride as a precipitant. A layered model of the structure of the investigated films based on the calculated electron density distribution in a lysozyme molecule is proposed. It is shown that the model obtained in this way allows one to refine the structure of investigated films when processing reflectivity data.
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