Abstract

The trapping and release of deuterium implanted with an energy of 100 eV in wrought and in plasma sprayed tungsten of different manufacture and structure has been investigated by means of re-emission as well as thermal and isothermal desorption spectroscopy. The experimental data for wrought tungsten are compared with model calculations with the PIDAT code in order to estimate the parameters governing diffusion, surface recombination and trapping in tungsten. The amount of retained deuterium in tungsten is of the same order of magnitude as in graphite for the implantation parameters used in this work. The mobile hydrogen concentration in tungsten during the implantation is of the same order of magnitude than the trapped one, being released after the termination of the implantation. The fraction of deuterium trapped to defects increases strongly with the porosity of the samples. The temperature needed for the release of the trapped deuterium (∼ 600 K) are considerably lower than for graphite, due to the smaller trapping energy (≤ 1.5 eV).

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