Abstract
In this research, the reduction of deoxynivalenol (DON) and nivalenol (NIV) concentrations in wheat was investigated using two types of optical sorters: a full color belt sorter (model CS-300, Satake Corp., Hiroshima Japan), which measures a material's optical characteristics in the RGB wavelength range, and an optical sorter (model RMGS561, Satake Corp.), which measures a material in the near-infrared wavelength range over 1400 nm. The results showed that the removal of Fusarium-contaminated grains from material wheat (wheat before sorting) using the optical sorters successfully reduced the DON and NIV concentrations of the material wheat. It was statistically proven that this reduction was due to the removal of contaminated grains with optimum sensitivity settings in the optical sorters. Furthermore, it was also confirmed that the 2.29 ppm DON concentration of the material wheat can be reduced below the tentative DON regulation level in Japan (1.1 ppm) at 95% product yield after sorting. Moreover, the 1.20 ppm NIV concentration of the material wheat can be reduced by 50% to 60% using the same optical sorter.
Published Version
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