Abstract
Using the surface forces apparatus, we have brought into contact a thermally evaporated silver film with a smooth mica sheet and have measured the time-dependent changes in the wavelengths of fringes of equal chromatic order generated using multiple beam interferometry. Based on a theoretical analysis of the interference fringes produced for a silver surface with prescribed roughness, the wavelength shifts that we observe can be explained by an irreversible reduction in the roughness of the silver surface. Assuming a sinusoidal profile for the silver surface, our measured wavelength shifts correspond to a decrease in root-mean-squared roughness from between 10 and 30 A
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