Abstract
The magnetism of Cr thin films in Fe/Cr multilayers was studied using ${}^{119}\mathrm{Sn}$ subatomic layers inserted in the Cr layers as a M\"ossbauer probe for Cr layer thickness from 10 to 160 \AA{}. The size and direction of the Cr magnetic moments were inferred from the size and direction of the magnetic hyperfine fields at the Sn nuclear sites. The detected magnetic hyperfine fields indicate that the Cr magnetic moments reduce as the Cr layer thickness decreases, while they do not remarkably change as a function of the distance from the Fe/Cr interface. The magnetic hyperfine fields for the samples grown at 200 \ifmmode^\circ\else\textdegree\fi{}C are smaller and more oriented to the film plane than for the samples grown at room temperature. These observations suggest that the magnetic frustration resulting from Fe/Cr interface imperfections is accommodated by the reduction of the Cr magnetic moments for the samples grown at elevated temperatures, whereas it is accommodated by the reorientation of Cr magnetic moments toward the perpendicular direction to the Fe magnetic moments for the samples grown at lower temperatures.
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