Reducing Wafer Delay Time by Robot Idle Time Regulation for Single-Arm Cluster Tools

Abstract

Nowadays, wafer fabrication in semiconductor manufacturing is highly dependent on cluster tools. A cluster tool is equipped with several process modules (PMs) and a wafer handling robot. When the tool is operating, generally each PM is processing a wafer, and the robot is responsible for delivering the wafers from one PM to another. Thus, when a wafer is completed in a PM, the robot may be busy for performing other tasks such that it cannot immediately unload the completed wafer in the PM, resulting in that the wafer has to stay there for some extra time. The processing time of a wafer together with its delay time for waiting for the robot’s arrival for unloading is defined as wafer residency time in a PM. However, a long wafer delay time may deteriorate its quality. Therefore, it is highly desired and important to reduce the wafer delay time at each step as much as possible. This work aims to tackle this important issue for single-arm cluster tools (SACTs). Specifically, by using a Petri net model, this work analyzes the steady-state operational behavior of an SACT under the backward and earliest starting strategies. It is found that there must exist wafer delay time at the steps in the upstream of the bottleneck step, and such wafer delay time can be reduced by properly adjusting the robot waiting time. Thus, three algorithms are developed to reduce the wafer delay time at each step as much as possible by properly assigning the robot idle time. Finally, the application of the proposed method is illustrated by using examples. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Note to Practitioners</i> —In a modern semiconductor fab, there are hundreds of cluster tools for wafer fabrication. To ensure wafer quality, it is important to reduce the wafer delay time in PMs of cluster tools after a wafer is processed since the high temperature, chemical gas, and particles in the PMs may damage the wafer. To do so, this work proposes three algorithms with polynomial complexity to assign the robot idle time as robot waiting time such that the wafer delay time in PMs can be reduced as much as possible. Furthermore, the obtained schedule by these algorithms is optimal in terms of the cycle time. Besides, the developed algorithms can be easily embedded into the controller of cluster tools by facility engineers. Therefore, this work has a practical value.