Abstract
循环冗余校验(CRC)算法在很多领域都有广泛的应用。对于确定格式的CRC校验码生成多项式，其错误漏检率基本为确定值。因此待检数据的长度越大，出现错误而不会被检测到的机会也就越多。为了解决这方面存在的问题，该文利用无损压缩霍夫曼算法缩短待测数据的长度，从而降低了数据出错之后不能被检测到的概率。并设计出相应的可靠性校验电路。与单纯使用CRC校验的方法相比，该文提出的方法可以将出错的几率下降为原来的万分之一以下。设计得到的电路模块可以作为VLSI中的可靠性电路模块(IP)加以利用。
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