Reduced Probability of Noise Introduced Malfunction in RSFQ Circuits by Implementing Intrinsic $\pi$-Phaseshifter

Abstract

The rapid single flux quantum electronics is characterized by a low switching energy, which makes it susceptible to noise introduced bit-errors. For industrial applications a certain noise immunity is required which is still a challenge especially for circuits of higher complexity. We analysed the influence of each individual resistor in a toggle flip-flop circuit to the overall bit-error rate. The shunt resistors of comparator structures are the dominant noise sources and bias resistors have almost no influence.