Abstract
Precise determinations of the variation in Al concentration in β‐sialon grains of the garnet and cordierite sialon systems were made by means of quantitative energy‐dispersive X‐ray analysis in an analytical electron microscope. Different signs of the concentration gradients in the grain indicate differences in secondary crystallization mechanisms, while Al distributions with respect to grain size indicate a changing glass‐silicon nitride compatability during crystallization. The technique was also applied to the glassy grain‐boundary phase allowing the determination of the glass‐forming region of the cor‐dierite‐sialon system. A detailed evaluation of errors in analytical transmission electron microscopy (AEM) is described.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
