Abstract
Single crystal Cr5Te8 with basic trigonal cell was grown by the chemical vapor transport (CVT) method and the crystal structure was determined by single crystal X-ray diffraction. The as grown Cr5Te8 was crystallized in space group P-3m1 with a = 3.8972(11) Å and c = 5.9965(18) Å. Typical energy-dispersive x-ray spectra (EDS) suggesting the ratio of Cr and Te is around 38.5% and 61.5%. The electrical resistivity was measured by four-probe method at range from 2 to 350 K, and the result suggested an abnormal trend around 25 K. There is no evidence of structural transition through the Raman spectra collected at range from 8 to 325 K, which reveals the magnetic and electrical properties are independent of structural changes under low temperature. The Cr5Te8 crystal was expected as a potential magnetoelectric coupling material, considering the magnetic transition around 20 K.
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