Abstract
Fast recrystallization is a decisive factor to achieve high recording data rates in phase change recording. 1 Recrystallization velocities can be determined by observing the reflected laser power in real time during the interaction of the laser with the sample. 2 We compare real time recrystallization velocity measurements applied to phase change optical disk media with and without a nitride interface layer. Nitride doping and nitride interface layers have shown to increase the cyclability behavior of phase change optical disks using GeSbTe as active and ZnS-SiO 2 as protective material. It is found that this effect is correlated to an enhancement of the recrystallization velocity.
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