Abstract
This spin-stand measurement study focuses on recording characteristics at submicron scale track width. The pole tips of a set of identical thin film heads were trimmed from the air-bearing surface by focused ion beam etching. A set of thin film heads with track widths ranging from W=2 μm to W=0.5 μm were produced. Recording experiments were performed on a high precision spin-stand tester using these heads. Both on-track and off-track performances were studied and analyzed. As the track width is scaled down, degrading of recording performance is observed. When the width of a recording head is decreased, the onset of partial erasure occurs at a lower density, and the noise power per unit head track width increases. Further investigation on the track profiles reveals that the extent of partial erasure is higher at the track edge as density increases, and this phenomenon is more pronounced in narrower track width heads.
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