Recorded Low Power Dissipation in Highly Reliable 1060-nm VCSELs for “Green” Optical Interconnection

Abstract

1060-nm VCSELs with low power dissipation and high reliability are demonstrated. We designed 1060-nm VCSELs with double intracavity structure to achieve high reliability and low power dissipation for the optical interconnection. We performed evaluations of an error-free 10-Gbps operation at low bias current, and the recorded low power dissipation per data rate of 0.14 mW/Gbps was achieved. Even though the modulation amplitude of the input signal was as small as 75 mVp-p, the extinction ratio of 6.5 dB was observed. From accelerating aging tests with 4898 devices, no random failure was observed, and high reliability of 30 failures in term (FITs)/channel with a confidence level of 90% was achieved.