Abstract

The introduction of intermediate band (IB) into the bandgap of silicon (Si) is an efficient way to enhance light absorption of Si in the short-wave infrared region. In this article, we report inert element argon (Ar)-hyperdoped Si ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\sim$</tex-math> </inline-formula> 10 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{\text{21}}$</tex-math> </inline-formula> cm <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{-\text{3}}\text{)}$</tex-math> </inline-formula> materials and photodetectors by double-doping technique of ion-implantation followed by pulsed laser doping. The pulsed laser irradiation after ion-implantation process can not only serve as postannealing to improve the crystalline quality of ion-implanted layer, but also be used for re-hyperdoping of Ar atoms to enhance the infrared absorptance ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\sim$</tex-math> </inline-formula> 20% at 1.31 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu$</tex-math> </inline-formula> m) of Ar-hyperdoped Si. The n <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$^{+}$</tex-math> </inline-formula> -n-junction based on the build-in carrier concentration difference between Ar-hyperdoped layer and Si substrate shows perfect rectification characteristics. The Ar-hyperdoped Si double-contacts photodiodes show the responsivity of 0.975 A/W for 1.31 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu$</tex-math> </inline-formula> m and 1.28 A/W for 1.55 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu$</tex-math> </inline-formula> m at 12-V reverse bias, respectively. To the best of our knowledge, they are the record-breaking performances for bulk Si photodetector at these subbandgap wavelengths working at a mild voltage. This work demonstrates the potential application of inert element-hyperdoped Si in the field of infrared photodetection.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.