Abstract
The article is devoted to elaboration of the method of reconstruction of rough surface scattering properties. The object with rough surface is made of transparent dielectric material. Typically these properties are described with bi-directional scattering distribution function (BSDF). Direct measurement of such function is either impossible or very expensive. The suggested solution provides physically reasonable method for the rough surface BSDF reconstruction. The method is based on Monte-Carlo ray tracing simulation for BSDF calculation. Optimization technique is further applied to correctly reconstruct the BSDF. The results of the BSDF reconstruction together with measurement results are presented in the article as well.
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