Reconstruction of laser-induced microstructures temperature profiles

Abstract

Metallic microstructures are currently widely used in micro-optoelectronics, sensorics, microfluidics, and other applications. A promising direction in the creation of such microstructures is pulsed laser processing of thin metal films. To improve laser technologies and simulate ongoing processes, data on the temperature fields that arise during laser exposure are needed. The article shows that the temperature distribution on the surface of a material during pulsed laser heating can be obtained from optical, scanning electron or atomic force micrographs. The proposed approach opens up the possibility of estimating temperature fields from archival photographs of various microstructures.