Reconstruction of aluminum and indium overlayers on Si(111): A systematic study with high-resolution electron energy loss spectroscopy and low-energy electron diffraction

Abstract

We describe a detailed study of the different reconstructions obtained by depositing Al or In overlayers on Si(111)2×1 and Si(111)7×7 substrates, and of the reconstructions obtained by thermal annealing of these overlayers. We correlate the information obtained by low-energy electron diffraction (LEED) with high-resolution electron energy loss spectra (HREELS).