Recombination pathways and hole leakage behavior in InGaN/GaN multiple quantum wells with V-shaped pits

Abstract

Abstract Hole transport in InGaN/GaN multiple quantum wells (MQWs) LEDs has been proposed to be insufficient due to relatively large effective mass and low mobility. Here, for the first time, we have direct observed hole overflow from MQWs and enter into InGaN/GaN superlattices (SLs) layer in V-pits-containing GaN-based green LEDs at room temperature. To suppress the hole leakage, an n-AlGaN hole blocking layer (HBL) is inserted between SLs layer and MQWs. The experimental show an interesting and baffling result is that the HBL-containing sample not only exhibits severe hole leakage in high current density range, but also has higher external quantum efficiency (EQE). Numerical simulation reveals that the HBL can change the transportation path of carriers, forcing more electrons injecting from c-plane into the MQWs instead of from V-pit sidewalls. This will increase the carrier concentration in the MQWs, and eventually lead to higher EQE. Meanwhile, less electrons transported through V-pit allowed more holes injecting into deeper layers via V-pit sidewalls, and electroluminescence emission from the SLs layer became stronger when HBL was inserted.