Abstract

Agglomeration is a major challenge in the research of nanodielectrics. Recognition of agglomerates in scanning electron microscopy (SEM) images can effectively support tackle this issue. Motivated by the fast development of image recognition, we propose a new approach for agglomerates recognition in SEM images of nanodielectrics by semantic segmentation algorithm. On the basis of convolutional neural network, pixel blocks classification network and full convolutional segmentation network employed with data augmentation are investigated in this work. Both networks can preliminarily recognize the agglomerates of spherical silica-based blend polyethylene nanocomposites. The average intersection over union (mIoU) of the pixel blocks classification network is 0.837 and it takes 48 seconds to process an image, while the mIoU of the full convolutional segmentation network is 0.777 and it takes 0.059 seconds to process an image.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.