Abstract

This paper reports the latest technological development on the Low Gain Avalanche Detector (LGAD) and introduces a new architecture of these detectors called inverse-LGAD (iLGAD). Both approaches are based on the standard Avalanche Photo Diodes (APD) concept, commonly used in optical and X-ray detection applications, including an internal multiplication of the charge generated by radiation. The multiplication is inherent to the basic n++–p+–p structure, where the doping profile of the p+ layer is optimized to achieve high field and high impact ionization at the junction.The LGAD structures are optimized for applications such as tracking or timing detectors for high energy physics experiments or medical applications where time resolution lower than 30ps is required. Detailed TCAD device simulations together with the electrical and charge collection measurements are presented through this work.

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