Abstract
Kerr system electrical measurement techniques are improved by progress in two important areas: 1) in the development of methods for visualizing and measuring pulsed (microsecond) electric fields and high voltages from time-varying electrooptical fringe patterns recorded using high-speed photographic techniques, and 2) in the development of convenient experimental methods for evaluating and correcting path-dependent errors in Kerr system response. Results demonstrate use of fringe-pattern measurements in achieving accurate pulse voltage measurements and in correction of errors resulting from sizeable end-field variations in existing 300-kV Kerr cells.
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