Recent progress of graphene orientation determination technology based on scanning probe microscopy

Abstract

Graphene is regarded as an excellent substitute for silicon and an ideal chip material for the next generation of chip manufacturing. Researches show that the electrical properties of graphene are closely related to its edge structures. Graphene can exhibit metal or semiconductive characteristics according to the different edge configurations. How to fabricate graphene nanoribbons with specific edge structures is the key premise for practical applications. The review highlights the new graphene crystal orientation detection methods based on scanning probe technology, including offline detection technology and online detection technology. The advantages and disadvantages of different detection technologies are analysed, and finally, a brief outlook for the development of graphene orientation determination techniques is given.