Abstract
The super-resolution imaging technique of structured illumination microscopy (SIM) enables the mixing of high-frequency information into the optical transmission domain via light-source modulation, thus breaking the optical diffraction limit. Correlative SIM, which combines other techniques with SIM, offers more versatility or higher imaging resolution than traditional SIM. In this review, we first briefly introduce the imaging mechanism and development trends of conventional SIM. Then, the principles and recent developments of correlative SIM techniques are reviewed. Finally, the future development directions of SIM and its correlative microscopies are presented.
Highlights
Enables the mixing of high-frequency information into the optical transmission domain via lightsource modulation, breaking the optical diffraction limit
In structured illumination microscopy (SIM), the sinusoidal excitation light is superimposed on the sample, which passes through the objective, and the observed fluorescence emission takes the form of a Moiré fringe
Pattern (± k a ), some high-frequency information is contained in the optical transfer⃑function (OTF) passband
Summary
A well-known tenet of the theory of optical imaging is that diffraction prevents the. Within the OTF passband can be detected, where |k0 | is the cutoff frequency of the system (Figure 2D), and information higher thanPSF the and cutoff frequency will transform be lost. → high-frequency information is contained in the OTF passband. Pattern (± k a ), some high-frequency information is contained in the OTF passband. The Fourier transform of sinusoidal illumination pattern I ( k ) purely consists of delta pulses [40] and is expressed as (Figure 2E):. The frequency-domain information of the sample in a single direction has been expanded to improve the resolution (Figure 3C). Extended OTF passband. (D) Expansion spectrum of multi-directional frequency
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