Abstract
To meet the challenges raised by the fabrication of nanoelectronic devices on currently available micro/nano technologies, article number 2100456 by Jianlei Cui and colleagues reviews the essential principles and recent applications of near-field tip enhancement induced by laser-irradiated scanning probe microscope probe tips. Such key applications include nanofabrication, nano-joining, and nanomanipulation, which are expected to serve a critical role in the fabrication of nanoelectronic devices.
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