Abstract
Emission characteristics of individual micro emitters on a FEA have been measured by use of a laboratory made emission microscope. It was found that the total emission current is apparently stable, but the individual emitter current is unstable. The fluctuating modes can be classified into two categories: apparent dependence on the IP product, where I is total emission current and P is the residual gas pressure in the vacuum, and no such dependency. The former type of fluctuation is successfully interpreted by our model that ionic hitting from the gate electrode causes the fluctuation.
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