Recent developments in atomic spectrometry methods for elemental trace determinations

Abstract

Methods for atomic spectrometry are discussed in view of progress for elemental trace analysis and with special reference to progress in power of detection and in analytical reliability as well as with respect to economic aspects. Optical methods basing on atomic emission, absorption and fluorescence principles as well as related techniques (optogalvanic spectroscopy and coherent forward scattering), X-ray spectrometry and mass spectrometry are treated. The state-of-the-art, trends of development and new techniques such as special sample introduction for plasma spectrometry, glow discharges, laser enhanced ionization spectrometry with a thermionic diode, X-ray spectrometry with total reflection, plasma and glow discharge mass spectrometry are drawn up. Their potential interest from the point of power of detection, multielement capacity, interferences, capabilities for micro- and local analysis and speciation is compared with that of other methods for elemental analysis.