Abstract
The present manuscript reports the characteristics of a novel Low Energy X-ray Fluorescence (LEXRF) system installed at the TwinMic X-ray Microscopy station operated at Elettra synchrotron (Trieste, Italy). The setup has been recently upgraded to an 8 large area Silicon Drift Detectors (SDD) system able to collect the XRF fluorescence emitted by the specimen in the 180-2200 eV energy range. The LEXRF system in an X-ray microscope has allowed combining chemical specificity of the specimen with the morphological information acquired in transmission at submicron length scales. Distinct advances of the new set-up are related to software system that has introduced new algorithms and methods.
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