Abstract
CL examination of geological materials has in the past been performed using optical microscope based systems that have incorporated a vacuum chamber and electron flood gun attached to the sample plinth. The use of these for the study of materials such as quartz has been limited due to the low accelerating voltages (V ≤ 10 kV) employed coupled with extremely low photon collection efficiencies.Electron microscope based systems are not subject to these limitation since collection optics offering efficiencies approaching 80% may be used. In addition, a range of accelerating voltages up to 10kV are routinely available. Until recently, only monochrome images displaying intensity variations were obtainable. It is now possible to obtain colour images displaying both wavelength and intensity variations across samples with a resolution that exceeds that of optical based systems.
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