Abstract
In recent years, the electromagnetic compatibility (EMC) of integrated circuits (ICs) has been addressed by the scientific and industrial community to measure and model parasitic emissions, as well as susceptibility to radio-frequency interference, in order to compare, predict, and improve the EMC performance of components. The EMC community has made significant progresses on the emission aspects, with the release of mature standards, models, tools, and guidelines. However, the immunity of ICs is still under extensive research. The goal of this paper is to highlight the most-recent advances in immunity measurement, modeling at the integrated-circuit level, and to highlight research publications giving design guidelines for improved immunity. The visions of the standardization committee on the immunity-measurement methods and modeling approaches are also detailed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
