Abstract
Journal Article Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces Get access Felix Kollmer, Felix Kollmer IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Alexander Pirkl, Alexander Pirkl IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Sven Kayser, Sven Kayser IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Henrik Arlinghaus, Henrik Arlinghaus IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Rudolf Moellers, Rudolf Moellers IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Nathan Havercroft, Nathan Havercroft IONTOF USA, Inc., Chestnut Ridge, New York, United States Search for other works by this author on: Oxford Academic Google Scholar Ewald Niehuis Ewald Niehuis IONTOF GmbH, Münster, Nordrhein-Westfalen, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 76–77, https://doi.org/10.1017/S143192762001329X Published: 01 August 2020
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