Real-Time X-Ray Diffraction For Materials Process Control

Abstract

As useful as classical x-ray diffraction techniques have been, the ability to obtain x-ray diffraction images with extremely short exposure rimes opens up new opportunities for materials scientists, including real-time materials process control. This article briefly describes state-of-the-art systems for obtaining extremely rapid and real-time x-ray diffraction images and gives several examples of their applications for materials process control.Two generic electro-optical methods permit real-time viewing and recording of x-ray diffraction images. The first uses a low-intensity conventional x-ray tube source leading to a low-intensity diffraction image, which requires a high-gain electro-optical imaging system. The second uses either a high-intensity rotating anode, synchrotron, or flash x-ray source. Such a high-intensity source produces a high-intensity diffraction image, permitting use of a low-gain high-resolution electro-optical imaging system.Figure 1 schematically shows two types of image intensifier tubes which have been most often used to view x-ray diffraction images. By cascading three individual first generation image tube stages (Figure 1a), light gains as high as several million can be obtained. The second generation microchannel-plate image intensifier tube (Figure 1b) is similar to a single-stage first generation device except for the extremely important addition of a microchannel plate.