Abstract
Dynamic mapping of an object’s local temperature distribution may offer valuable information for failure analysis, system control and improvement. In this letter we present a computerized measurement system which is equipped with a hybrid, low-noise mechanical-electrical multiplexer for real-time two-dimensional (2D) mapping of surface temperatures. We demonstrate the performance of the system on a device embedded with 32 pieces of built-in Cr-Pt thin-film thermocouples arranged in a 4 × 8 matrix. The system can display a continuous 2D mapping movie of relative temperatures with a time interval around 1 s. This technique may find applications in a variety of practical devices and systems.
Highlights
In the past decade, with the rapid development of smart cellphones, wearable and flexible electronics, bioscience and lab-on-a-chip systems, thermal management became a new technological frontier
We report a temperature measurement system with one nanovoltmeter, a hybrid electrical-mechanical multiplexer and an array of built-in Cr-Pt thin-film thermocouples (TFTCs) arranged in an nm matrix
We have presented here a temperature measurement system with a hybrid electrical-mechanical
Summary
With the rapid development of smart cellphones, wearable and flexible electronics, bioscience and lab-on-a-chip systems, thermal management became a new technological frontier. For novel electronic devices and systems, besides focusing on chip-level thermal management alone, system-level solutions have received much attention. A real-time two dimensional (2D) mapping of the temperature distribution in individual chips and of the whole system could offer unique information for failure analysis, for the improvement of devices and systems, and even for finding optimized dynamic solutions for thermal management [1,2]. For micro- and nano-fluidic systems, real-time 2D mapping of temperature distribution is helpful for a better understanding of local bio-chemical reactions and for better control of the devices. Many techniques have been developed for real-time mapping of surface temperatures, such as infrared imaging, liquid crystal thermography, fluorescence imaging and scanning thermal microscope (SThM), etc. By analyzing the tiny density changes in 80-nanometer-thick aluminum wires using the electron energy loss spectroscopy technique, Mecklenburg et al recently obtained
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