Abstract
We present real-time waveform characterization of ultrashort pulses by the use of a pulse-front tilt in frequency-resolved optical gating capable of carrier-envelope phase determination. Simultaneous measurement of cross-correlation frequency-resolved optical gating and electro-optic sampling signals has been realized without scanning any delays. Complete waveform characterization of single-cycle infrared pulses in real time has been demonstrated. The method has been also applied for characterization of more complex pulses, namely, a strongly chirped pulse after passing through a solid crystal or a distorted pulse due to the absorption of ambient air.
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